Reliable MicroSystems
Cameron Moyers
Junior Staff Engineer
What you
should know About Cameron Moyers
should know About Cameron Moyers
Publications
In extreme environments, as expected in earth orbit, exploratory space, or even in the specialized environments of nuclear reactors or nuclear weapons, microelectronic circuitry must endure a host of radiation hazards…
The creation of soft errors due to the propagation of single event transients (SETs) is a significant reliability challenge in modern CMOS logic. SET concerns continue to be exacerbated by Moore’s Law technology scaling…
This paper discusses several attributes of integrated circuit scaling in relation to radiation soft error failure modes and vulnerability.
Physical mechanisms responsible for nondestructive single-event effects in digital microelectronics are reviewed, concentrating on silicon MOS devices and integrated circuits…
Engineering Team
Cameron Moyers
Junior Staff Engineer
Cameron Moyers received his B.S. degree in Electrical Engineering from the University of Tennessee at Chattanooga in 2021. He worked as an undergrad Research Assistant for the Extreme Environment Technologies Lab, where the area of research included VLSI design.
Cameron joined Reliable Microsystems as an intern in May 2021 and began full time employment in January 2022. Since joining Reliable MicroSystems, he has specialized in the development of radiation-effects-enabled compact models for use in the design of radiation-hardened electronics.
Cameron is actively involved in the extraction and calibration of electrical and radiation-enabled model parameters.
