Reliable MicroSystems
Connor Sanders
Junior Staff Engineer
What you
should know About Connor Sanders
should know About Connor Sanders
Publications
In extreme environments, as expected in earth orbit, exploratory space, or even in the specialized environments of nuclear reactors or nuclear weapons, microelectronic circuitry must endure a host of radiation hazards…
The creation of soft errors due to the propagation of single event transients (SETs) is a significant reliability challenge in modern CMOS logic. SET concerns continue to be exacerbated by Moore’s Law technology scaling…
This paper discusses several attributes of integrated circuit scaling in relation to radiation soft error failure modes and vulnerability.
Physical mechanisms responsible for nondestructive single-event effects in digital microelectronics are reviewed, concentrating on silicon MOS devices and integrated circuits…
Engineering Team
Connor Sanders
Junior Staff Engineer
Connor Sanders received his B.S. in Computer Science from Auburn University in 2022, where he was a member of the Association for Computing Machinery and the Competitive Programming Team.
While attending school, he worked part-time as a software engineer at HDI Solutions LLC, where he gained experience working on government systems to support internal agency processes as well as statewide programs encompassing billions of data elements.
Connor joined Rel-Micro in February 2023 and primarily works on model extraction and optimization.
