Reliable MicroSystems
Daniel Vibbert
Internship (2021)
What you
should know About Daniel Vibbert
should know About Daniel Vibbert
Publications
In extreme environments, as expected in earth orbit, exploratory space, or even in the specialized environments of nuclear reactors or nuclear weapons, microelectronic circuitry must endure a host of radiation hazards…
The creation of soft errors due to the propagation of single event transients (SETs) is a significant reliability challenge in modern CMOS logic. SET concerns continue to be exacerbated by Moore’s Law technology scaling…
This paper discusses several attributes of integrated circuit scaling in relation to radiation soft error failure modes and vulnerability.
Physical mechanisms responsible for nondestructive single-event effects in digital microelectronics are reviewed, concentrating on silicon MOS devices and integrated circuits…
Vanderbilt University
Daniel Vibbert
Internship (2021)
Daniel Vibbert received his M.S. degree in electrical engineering from Vanderbilt University in 2018 and his B.S. degree in electrical engineering from University of Evansville in 2016. Daniel Vibbert joined Reliable MicroSystems as an intern in February of 2021, and is pursuing a Ph.D. at Vanderbilt University. Since 2016, he has studied radiation effects at Vanderbilt’s Institute of Space and Defense Electronics (ISDE), where he specialized in radiation-hardening-by-design (RHBD) techniques, such as Sensitive-Node Active Charge Cancellation (SNACC).
In 2018, he also began his specialization in the development of radiation transport simulation software as well as the design of graphical user interfaces for radiation-enabled tools.
