Grant D. Poe received his B.S. in Electrical Engineering from the University of Tennessee, Knoxville in 2015 and his M.S. in Electrical Engineering from Vanderbilt University in 2019. From 2017 to 2019 he worked as a Research Assistant at Vanderbilt University’s Institute for Space and Defense Electronics where he utilized layout aware node spacing techniques in creating custom layouts to develop a novel memory circuit for radiation hardness and low power operation. He joined Reliable MicroSystems as a full-time engineer in 2019, and at RMS has worked extensively towards radiation characterization in a 14/16-nm technology node. This work included custom layouts and novel digital designs for on board radiation characterization.

The focus of his research is towards creating new digital designs for radiation hardness and low power, while also designing circuits to monitor the response of these and other existing designs. This includes evaluating technology nodes, as well as individual circuit designs, across custom design variables and radiation environments to create and refine predictive simulation models.