In extreme environments, as expected in earth orbit, exploratory space, or even in the specialized environments of nuclear reactors or nuclear weapons, microelectronic circuitry must endure a host of radiation hazards…

The creation of soft errors due to the propagation of single event transients (SETs) is a significant reliability challenge in modern CMOS logic. SET concerns continue to be exacerbated by Moore’s Law technology scaling…

This paper discusses several attributes of integrated circuit scaling in relation to radiation soft error failure modes and vulnerability.

Physical mechanisms responsible for nondestructive single-event effects in digital microelectronics are reviewed, concentrating on silicon MOS devices and integrated circuits…