Reliable MicroSystems
Hunter Black
Administrative Assistant
What you
should know About Hunter Black
should know About Hunter Black
Publications
In extreme environments, as expected in earth orbit, exploratory space, or even in the specialized environments of nuclear reactors or nuclear weapons, microelectronic circuitry must endure a host of radiation hazards…
The creation of soft errors due to the propagation of single event transients (SETs) is a significant reliability challenge in modern CMOS logic. SET concerns continue to be exacerbated by Moore’s Law technology scaling…
This paper discusses several attributes of integrated circuit scaling in relation to radiation soft error failure modes and vulnerability.
Physical mechanisms responsible for nondestructive single-event effects in digital microelectronics are reviewed, concentrating on silicon MOS devices and integrated circuits…
Administrative Team
Hunter Black
Administrative Assistant
Hunter is an Administrative Assistant at Rel-Micro with several years of experience working in law firm management. He has experience working in small business and navigating the challenges that arise. He is a TN native, grew up in Tullahoma, TN. He holds a Bachelor of Science degree in Business Management for University of Tennessee at Chattanooga (UTC). In his spare time he enjoys golfing, spending time with his family, and travel.
