Reliable MicroSystems

Julia Buckley

Chief Operations Officer (COO)
What you
should know About Julia Buckley


In extreme environments, as expected in earth orbit, exploratory space, or even in the specialized environments of nuclear reactors or nuclear weapons, microelectronic circuitry must endure a host of radiation hazards…
The creation of soft errors due to the propagation of single event transients (SETs) is a significant reliability challenge in modern CMOS logic. SET concerns continue to be exacerbated by Moore’s Law technology scaling…
This paper discusses several attributes of integrated circuit scaling in relation to radiation soft error failure modes and vulnerability.
Physical mechanisms responsible for nondestructive single-event effects in digital microelectronics are reviewed, concentrating on silicon MOS devices and integrated circuits…

Management Team

Julia Buckley

Chief Operations Officer (COO)

Julia Buckley is the Chief Operations Officer for Reliable MicroSystems. She received her B.S. degree in Biology from Lipscomb University. She joined Rel-Micro in 2018. Before joining Rel-Micro, Julia worked as a Laboratory Manager for a Molecular Science and Pathology Laboratory at the University of Florida. Her projects focused on laryngeal and lung cancer research. Julia has also performed cancer research as a Research Assistant in a Cell and Development Biology Laboratory at Middle Tennessee State University. Projects there focused on planar cell polarity during cell migration.

Julia gained office management experience as an Office Manager for Florida Department of Children and Families and for Tri-Central Community Schools. Throughout her career Julia continuously volunteers as a tutor, first responder, and robotics club leader.

Reliable MicroSystems, LLC (Rel-Micro) is a world-class design organization specializing in concept-to-foundry creation and maturation of high-reliability electronic for mission-critical applications. We are based in Nashville, Tennessee


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