Tim Haeffner is a Senior Staff Engineer at Reliable MicroSystems, LLC.  Tim holds a B.S. in Electrical Engineering from the University of Wyoming and an M.S. in Electrical Engineering from Vanderbilt University.

Tim’s professional and engineering experience are as a circuit design engineer specifically radiation effects, hardware design, and physical layout design.  Tim has analog/mixed signal and digital design experience in bulk CMOS, silicon-on-insulator CMOS, and FinFET technologies with feature sizes from 350nm to 7nm.

Tim’s electrical engineering career started at Intel Corporation in Chandler, Arizona as a CAD engineer where he transitioned into a circuit design roll and worked to develop I/O circuitry in Intel’s 180nm and 130nm CMOS technologies. Tim left Intel and began working at Vanderbilt University’s Institute for Space and Defense Electronics (ISDE) in Nashville, Tennessee.

While working as a full-time radiation effects engineer at ISDE, Tim completed his M.S. in Electrical Engineering at Vanderbilt University.  During his time at ISDE and Vanderbilt University Tim contributed to over 25 technical/trade publications on radiation effects in microelectronic circuits and devices, most of which are published in Transactions on Nuclear Science (TNS). In 2022, Tim joined Reliable MicroSystems, LLC. as a Senior Staff Engineer.

Tim was born and raised in Wyoming and enjoys bow hunting, fly fishing and beach volleyball.