Reliable MicroSystems

Tim Haeffner

Senior Staff Engineer
Tim Heafner
What you
should know About Tim Haeffner


In extreme environments, as expected in earth orbit, exploratory space, or even in the specialized environments of nuclear reactors or nuclear weapons, microelectronic circuitry must endure a host of radiation hazards…
The creation of soft errors due to the propagation of single event transients (SETs) is a significant reliability challenge in modern CMOS logic. SET concerns continue to be exacerbated by Moore’s Law technology scaling…
This paper discusses several attributes of integrated circuit scaling in relation to radiation soft error failure modes and vulnerability.
Physical mechanisms responsible for nondestructive single-event effects in digital microelectronics are reviewed, concentrating on silicon MOS devices and integrated circuits…

Engineering Team

Tim Haeffner

Senior Staff Engineer

Tim Haeffner is a Senior Staff Engineer at Reliable MicroSystems, LLC.  Tim holds a B.S. in Electrical Engineering from the University of Wyoming and an M.S. in Electrical Engineering from Vanderbilt University.

Tim’s professional and engineering experience are as a circuit design engineer specifically radiation effects, hardware design, and physical layout design.  Tim has analog/mixed signal and digital design experience in bulk CMOS, silicon-on-insulator CMOS, and FinFET technologies with feature sizes from 350nm to 7nm.

Tim’s electrical engineering career started at Intel Corporation in Chandler, Arizona as a CAD engineer where he transitioned into a circuit design roll and worked to develop I/O circuitry in Intel’s 180nm and 130nm CMOS technologies. Tim left Intel and began working at Vanderbilt University’s Institute for Space and Defense Electronics (ISDE) in Nashville, Tennessee.

While working as a full-time radiation effects engineer at ISDE, Tim completed his M.S. in Electrical Engineering at Vanderbilt University.  During his time at ISDE and Vanderbilt University Tim contributed to over 25 technical/trade publications on radiation effects in microelectronic circuits and devices, most of which are published in Transactions on Nuclear Science (TNS). In 2022, Tim joined Reliable MicroSystems, LLC. as a Senior Staff Engineer.

Tim was born and raised in Wyoming and enjoys bow hunting, fly fishing and beach volleyball.

Reliable MicroSystems, LLC (Rel-Micro) is a world-class design organization specializing in concept-to-foundry creation and maturation of high-reliability electronic for mission-critical applications. We are based in Nashville, Tennessee


Copyright 2021 Reliable MicroSystems, LLC,
All Rights Reserved