Reliable MicroSystems

W. Timothy Holman

Subject Matter Expert
Tim Holman
What you
should know About Dr. W. Timothy Holman


In extreme environments, as expected in earth orbit, exploratory space, or even in the specialized environments of nuclear reactors or nuclear weapons, microelectronic circuitry must endure a host of radiation hazards…
The creation of soft errors due to the propagation of single event transients (SETs) is a significant reliability challenge in modern CMOS logic. SET concerns continue to be exacerbated by Moore’s Law technology scaling…
This paper discusses several attributes of integrated circuit scaling in relation to radiation soft error failure modes and vulnerability.
Physical mechanisms responsible for nondestructive single-event effects in digital microelectronics are reviewed, concentrating on silicon MOS devices and integrated circuits…

Engineering Team

Dr. W. Timothy Holman

Subject Matter Expert

W. Timothy Holman received his Ph.D. in Electrical Engineering from the Georgia Institute of Technology in 1994.  From 1987 to 1994 he was employed by the IBM Corporation, where he was involved in software and hardware development.  From 1994 to 2000 he was a faculty member in the Department of Electrical Engineering at the University of Arizona.  He is currently a Research Associate Professor of Electrical and Computer Engineering at Vanderbilt University, where he conducts fundamental research in the area of microelectronic circuit analysis and design, and a Senior Member of the IEEE.   He is also a member of the Vanderbilt Institute for Space and Defense Electronics where he participates in applied R&D activities in support of commercial space and military strategic systems.

Dr. Holman is an expert on the design of low noise / low power analog and mixed-signal (AMS) circuits and systems, the design of radiation-hardened circuits, the simulation and modeling of AMS circuits, and the design of radiation-hardened circuitry for deep submicron IC processes.  Dr. Holman has led the development of several new techniques for the radiation hardening of analog and mixed-signal integrated circuits, and assisted in the design of radiation-tolerant PLLs, DLLs, ADCs, voltage references, and operational amplifiers.  He has over 100 publications in analog and mixed-signal circuit modeling and simulation, including the design and simulation of radiation-hardened integrated circuits.

Reliable MicroSystems, LLC (Rel-Micro) is a world-class design organization specializing in concept-to-foundry creation and maturation of high-reliability electronic for mission-critical applications. We are based in Nashville, Tennessee


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